Skip to main content

This link is exclusively for students and staff members within this organisation.

Unauthorised use will lead to account termination.

Next

de Broglie waves

Atomic force microscopy

Atomic force microscopy (AFM) can reveal details of the shapes and other properties of surfaces on a nanometre scale

The terms in bold link to topics in the AQA, Edexcel, OCR, WJEC and CCEA A-level specifications, as well as the IB, Pre-U and SQA exam specifications.

AFM techniques use resonance to achieve precise measurements of surfaces, and can be used to study magnetic, thermal and electrical properties of materials.

Your organisation does not have access to this article.

Sign up today to give your students the edge they need to achieve their best grades with subject expertise

Subscribe

Next

de Broglie waves

Related articles: